SOLIYEV O.M. Analysis And Optimization Of Multilayer Silicon Structures Via Ellipsometry For Solar Cell Efficiency. American Journal of Applied Science and Technology, [S. l.], v. 5, n. 08, p. 54–59, 2025. DOI: 10.37547/ajast/Volume05Issue08-09. Disponível em: https://theusajournals.com/index.php/ajast/article/view/6880. Acesso em: 4 dec. 2025.