MUHAMMAD DANISH HAKIM. A Transparent Predictive Model for SSD Failure Detection Using Local and Global Explainability. American Journal of Applied Science and Technology, [S. l.], v. 6, n. 09, p. 25–32, 2026. DOI: 10.37547/ajast/Volume06Issue09-03. Disponível em: https://theusajournals.com/index.php/ajast/article/view/11605. Acesso em: 10 sep. 2026.